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Article No. LEI356121
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GPM3 Plane Plate Micrometer
2006 - 2008
Increases the accuracy of the Leica NA2 or NAK2 surveyor's levels
The plane plate micrometer can be attached above the telescope objective. This makes the NA2 or NAK2 the perfect precision level for deformation measurements or industrial surveys.
Warranty / Months : 24
Features
- As an extension of the level for precision levelling and
Control measurements.
- Convenient reading via the bright glass scale.
- Easy operation thanks to the attachment at the end of the eyepiece.
Video
Specifications
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Standard deviation for 1km double levelling
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0,3 mm
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Convenient reading via the bright glass scale.
As an extension of the level for precision levelling and
Control measurements.